12.01.09
Design Internship with WIRED
- Job Description:
WIRED magazine is currently looking for a design department intern for Spring 2010. The ideal intern can commit 25-30 hours per week from January through May in our San Francisco office. The internship is open to all third and fourth year full-time design students and must be taken for credit. You will participate as an active member of the ASME and SPD award-winning design department, working directly with the art directors, designers, photo department, production staffers, and editors. You'll be expected to help with front-of-book page layout, print out and distribute manuscripts, update and manage the wall displaying current issue pages, create illustrations in Adobe Illustrator for various parts of the magazine, scan items for the design department, organize all tear sheets and help with award submissions. Please email your cover letter, resume, and at least 5 pdf samples of your design work (or a link to portfolio site). Experience in InDesign, Illustrator, and Photoshop is a must. We value those who are interested in the WIRED culture, and those who are motivated, industrious, and eager to learn--with a desire to work in a challenging and creative editorial design environment. - Position: Other
- Area of Focus: Design
- City: San Francisco
- Region: BayArea
- Duration: Other
- About Our Company: WIRED is a monthly magazine published since March 1993 that reports on technology, science, culture, and business. Owned by Condé Nast Publications, it is published in the South of Market district of San Francisco, California. The current WIRED design team has won two ASME awards for design and has been twice named Society of Publication Designers' magazine of the year.
- Company: Condé Nast
- Contact Address: 520 3rd Street, Suite 305 San Francisco, CA 94107
- Contact Email:christy_sheppard@wired.com
- Contact Name: Christy Sheppard
- How to Apply: Please email your cover letter, resume, and at least 5 pdf samples of your design work (or a link to portfolio site).